Products related with IP 336
1-6 of 6
Determination of sulfur content - Energy-dispersive-X-ray fluorescence method
Rigaku NEX QC, Low Cost Energy Dispersive X-Ray Fluorescence (EDXRF) Analyzer
Elemental analysis of solids, liquids, powders, alloys and thin films. From sodium (Na) to uranium (U) in almost any matrix.
SKU | PSC-47-02768 |
MPN | 515827 |
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Rigaku NEX QC+, High-Resolution Energy Dispersive X-Ray Fluorescence (EDXRF) Analyzer
Elemental analysis of solids, liquids, powders, alloys and thin films. From sodium (Na) to uranium (U) in almost any matrix.
SKU | PSC-47-09177 |
MPN | 1002074 |
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Rigaku NEX QC+ QuantEZ, High-Resolution Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer
Elemental analysis of solids, liquids, powders, alloys and thin films
SKU | PSC-47-14791 |
MPN | 1012613 |
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Rigaku NEX DE, High-Resolution Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer
Elemental analysis of solids, liquids, powders, alloys and thin films
SKU | PSC-47-14789 |
MPN | 1013114 |
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Rigaku NEX DE VS, Variable Spot Size Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer
Elemental analysis of solids, liquids, powders, alloys and thin films
SKU | PSC-47-14790 |
MPN | 1014891 |
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Rigaku NEX CG II, Next-Generation Cartesian Geometry Energy Dispersive X-Ray Fluorescence Spectrometer
Enhanced elemental analysis for industrial quality control to advanced research applications
SKU | PSC-47-14792 |
MPN | 1029484 |
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