For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.

Features

• Analyze ₁₁Na to ₉₂U non-destructively
• Solids, liquids, alloys, powders and thin films
• 50 kV X-ray tube for wide elemental coverage
• SDD detector for superior resolution and sensitivity
• Modern smartphone style "icon driven" user interface
• Multiple automated tube filters for enhanced sensitivity
• Convenient built in thermal printer
• Low cost with unmatched performance-to-price ratio

EDXRF optimized for quality control applications

Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with high precision and broad elemental coverage

The shuttered 50 kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

EDXRF with autosampler and helium purge options

Options include automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.